1.

Conference Proceedings
Conference Proceedings
1. ON THE ELECTRICAL ACTIVITY OF OXYGEN-RELATED EXTENDED DEFECTS IN SILICON
Vanhellemont, J. ; Simoen, E. ; Bosman, G. ; Claeys, C. ; Kaniava, A. ; Gaubas, E. ; Blondeel, A. ; Clauws, P.
Pub. info.: Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology.  pp.670-683,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-10
2.

Conference Proceedings
Conference Proceedings
2. Tin Doping Effects in Silicon*
Simoen, E. ; Claeys, C. ; Neimash, V.B. ; Kraitchinskii, A. ; Kras'ko, M. ; Puzenko, O. ; Blondeel, A. ; Clauws, P.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.223-235,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
3.

Conference Proceedings
Conference Proceedings
3. A BEEM Study of PtSi Schottky Contacts on Ion-Milled Si
Ru, G-P. ; Detavernier, C. ; Donaton, R. A. ; Blondeel, A. ; Clauws, P. ; Meirhaeghe, R. L. Van ; Cardon, F. ; Maex, K. ; Qu, X-P. ; Zhu, S-Y. ; Li, B-Z.
Pub. info.: Advanced interconnects and contacts : symposium held April 5-7, 1999, San Francisco, California, U.S.A..  pp.201-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 564