1.

Conference Proceedings
Conference Proceedings
1. In-Depth Characterization of Damage Produced by Swift Heavy Ion Irradiation Using a Tapping Mode Atomic Force Microscope
Biro,L.P. ; Gyulai,J. ; Havancsak,K.
Pub. info.: Materials science applications of ion beam techniques : proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, incoeporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 9-12 1996.  pp.129-134,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 248-249
2.

Conference Proceedings
Conference Proceedings
2. Charge Carrier Lifetime Modification in Silicon by High Energy H+,He+ Ion Implantation
Khanh,N.Q. ; Tutto,P. ; Jaroli,E.N. ; Buiu,O. ; Biro,L.P. ; Paszti,F. ; Mohacsy,T. ; Kovacsics,C. ; Manuaba,A. ; Gyulai,J.
Pub. info.: Materials science applications of ion beam techniques : proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, incoeporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 9-12 1996.  pp.101-106,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 248-249
3.

Conference Proceedings
Conference Proceedings
3. Atomic force microscopy investigation of carbon nanotubes
Biro,L.P.
Pub. info.: Carbon Filaments and Nanotubes : Common Origins, Differing Applications?.  pp.255-264,  2001.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 372
4.

Conference Proceedings
Conference Proceedings
4. STM investigation of carbon nanotubes
Biro,L.P. ; Mark,G.I.
Pub. info.: Carbon Filaments and Nanotubes : Common Origins, Differing Applications?.  pp.219-232,  2001.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 372