1.

Conference Proceedings
Conference Proceedings
1. The role of buried oxide in the hot carrier degradation of ultra thin n-channel SOI MOSFETs
Huttner, T. ; Mahnkopf, R. ; Wurzer, H. ; Biebl, M. ; Abstreiter, G.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.277-282,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
2.

Conference Proceedings
Conference Proceedings
2. Oxidation-Enhanced Diffusion of Boron in Silicon-on-Insulator Substrates
Pindl, S. ; Biebl, M. ; Hammerl, E. ; Schaefer, H. ; von Philipsborn, H.
Pub. info.: ULSI science and technology, 1997 : proceedings of the Sixth International Symposium on Ultralarge Scale Integration Science and Technology.  pp.623-632,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-3