1.

Conference Proceedings

Conference Proceedings
Wasik,D. ; Dmowski,L. ; Mikucki,J. ; Lusakowski,J. ; Hsu,L. ; Walukiewicz,W. ; Bi,W.G. ; Tu,C.W.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.813-818,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Chen,W.M. ; Buyanova,I.A. ; Bi,W.G. ; Tu,C.W.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.805-812,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings

Conference Proceedings
Tu,C.W. ; Bi,W.G. ; Xin,H.P. ; Ma,Y. ; Zhang,J.P. ; Wang,L.W. ; Ho,S.T.
Pub. info.: In-Plane Semiconductor Lasers: from Ultraviolet to Mid-Infrared II.  pp.190-196,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3284