1.

Conference Proceedings
Conference Proceedings
1. Charge collection characterization of polycrystalline n-GaAs layers for solar cells
Paz, O. ; Bhat, K.N. ; Borrego, J.M.
Pub. info.: Grain boundaries in semiconductors : proceedings of the Materials Research Society annual meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.223-228,  1982.  New York.  North-Holland
Title of ser.: Materials Research Society symposia proceedings
Ser. no.: 5
2.

Conference Proceedings
Conference Proceedings
2. Microfabricated Ion Detectors and Sources for Chemical Analysis
Darling, R.B. ; Bhat, K.N. ; Scheidemann, A.A. ; Chen, T.C.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-1  pp.475-480,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746
3.

Conference Proceedings
Conference Proceedings
3. SOI Technology, Devices and Characterization
Bhat, K.N. ; Lakshmi, N. ; DasGupta, A.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-1  pp.576-583,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746
4.

Conference Proceedings
Conference Proceedings
4. Purification of organic nonlinear optical materials for bulk crystal growth from melt
Gebre, T. ; Bhat, K.N. ; Batra, A.K. ; Lal, R.B. ; Aggarwal, M.D. ; Penn, B.G. ; Frazier, D.O.
Pub. info.: Crystal materials for nonlinear optical devices and microgravity science : 8-9 July, 2002, Seattle, Washington, USA.  pp.36-42,  2002.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4813