1.

Conference Proceedings
Conference Proceedings
1. The Microstructure and Electromigration Performance of Damascene-Fabricated Aluminum Interconnects
Besser, Paul R. ; Sanchez, John E., Jr. ; Field, David P. ; Pramanick, Shekhar ; Sahota, Kashmir
Pub. info.: Polycrystalline thin films : structure, texture, properties and applications III : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A..  pp.313-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 472
2.

Conference Proceedings
Conference Proceedings
2. STRESS GRADIENT AND RELAXATION MEASUREMENTS IN Al AND OXYGEN-IMPLANTED Al FILMS
Besser, Paul R. ; Bader, Stefan ; Venkatraman, Ramnath ; Bravman, John C.
Pub. info.: Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A..  pp.255-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 309
3.

Conference Proceedings
Conference Proceedings
3. X-RAY DETERMINATION AND FINITE-ELEMENT MODELING OF STRESS IN PASSIVATED Al-0.5%Cu LINES DURING THERMAL CYCLING
Besser, Paul R. ; Mack, Anne Sauter ; Fraser, David ; Bravman, John C.
Pub. info.: Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A..  pp.287-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 309
4.

Conference Proceedings
Conference Proceedings
4. STRAIN RELAXATION AND IN-SITU OBSERVATION OF VOIDING IN PASSIVATED ALUMINUM ALLOY LINES
Besser, Paul R. ; Marieb, Thomas N. ; Bravman, John C.
Pub. info.: Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A..  pp.181-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 309
5.

Conference Proceedings
Conference Proceedings
5. EFFECT OF Cu AND Si IN ALUMINUM ON STRESS CHANGE AND ON TiAl3 FORMATION IN Al ALLOY/Ti BILAYER FILMS DURING ANNEALING
Brown, Dirk D. ; Besser, Paul R. ; Sanchez, John E., Jr. ; Korhonen, Matt A. ; Li, Che-Yu
Pub. info.: Thin films, stresses and mechanical properties V : symposium held November 28-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.471-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 356
6.

Conference Proceedings
Conference Proceedings
6. MECHANICAL BEHAVIOR OF SINGLE CRYSTAL Al (111) AND BICRYSTAL Al (110) FILMS ON SILICON SUBSTRATES
Besser, Paul R. ; Sanchez, John E., Jr. ; Brennan, S. ; Bravman, John C. ; Takaoka, G. ; Yamada, I.
Pub. info.: Polycrystalline thin films : structure, texture, properties, and applications : symposium held April 4-8, 1994, San Francisco, California, U.S.A..  pp.659-,  1994.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 343
7.

Conference Proceedings
Conference Proceedings
7. STRAIN RELAXATION AND IN-SITU OBSERVATION OF VOIDING IN PASSIVATED ALUMINUM ALLOY LINES
Besser, Paul R. ; Marieb, Thomas N. ; Bravman, John C.
Pub. info.: Thin films : stresses and mechanical properties IV : symposium held April 12-16, 1993, San Francisco, California, U.S.A..  pp.249-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 308
8.

Conference Proceedings
Conference Proceedings
8. X-RAY OBSERVATION OF STRESS GRADIENTS AND PRECIPITATION IN PASSIVATED A1-0.5%Cu FILMS
Besser, Paul R. ; Brennan, Sean ; Bravman, John C.
Pub. info.: Applications of synchrotron radiation techniques to materials science : symposium held April 12-15, 1993, San Francisco, California, U.S.A..  pp.161-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 307
9.

Conference Proceedings
Conference Proceedings
9. CALCULATION OF STRESS GRADIENTS IN THIN Al-0.5% Cu/Ti LINES FROM STRAIN GRADIENTS MEASURED AS A FUNCTION OF TEMPERATURE USING GRAZING INCIDENCE X-RAY SCATTERING
Besser, Paul R. ; Venkatraman, Ramnath ; Brennan, Sean ; Bravman, John C.
Pub. info.: Thin films : stresses and mechanical properties III : symposium held December 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.233-238,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 239
10.

Conference Proceedings
Conference Proceedings
10. DETERMINATION OF STRAIN DISTRIBUTIONS IN ALUMINUM THIN FILMS AS A FUNCTION OF TEMPERATURE BY THE USE OF SYNCHROTRON GRAZING INCIDENCE X-RAY SCATTERING
Venkatraman, Ramnath ; Besser, Paul R. ; Brennan, Sean ; Bravman, John C.
Pub. info.: Thin films : stresses and mechanical properties III : symposium held December 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.227-232,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 239