1.

Conference Proceedings
Conference Proceedings
1. Defects Characterization in SiC by Scanning Photoluminescence Spectroscopy
Masarotto, L. ; Bluet, J.M. ; Berenguer, M. ; Girard, P. ; Guillot, G.
Pub. info.: Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000.  pp.393-396,  2001.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 353-356
2.

Conference Proceedings
Conference Proceedings
2. Hall Mobility in Strained SiGe p-MOSFETs
Garchery, L. ; Sagnes, I. ; Campidelli, Y. ; Berenguer, M. ; Badoz, P. A. ; Guldner, Y. ; Zanier, S.
Pub. info.: Strained layer epitaxy - materials processing and device applications : symposium held April 17-19, 1995, San Francisco, California, U.S.A..  pp.333-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 379