Volpi, F. ; Peaker, A.R. ; Berbezier, I. ; Ronda, A.
Pub. info.:
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.88-95, 2003. Pennington, NJ. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Bremond, G. ; Ferrandis, P. ; Souifi, A. ; Ronda, A. ; Berbezier, I.
Pub. info.:
Growth, evolution and properties of surfaces, thin films and self-organized structures : symposium held November 27-December 1, 2000, Boston, Massachusetts, U.S.A.. 2001. Warrendale, Pa.. Materials Research Society
Kanoun, M. ; Souifi, A. ; Decossas, S. ; Dubois, C. ; Bremond, G. ; Bassani, F. ; Lim, Y. ; Ronda, A. ; Berbezier, I. ; Kermarrec, O. ; Bensahel, D.
Pub. info.:
Unconventional approaches to nanostructures with applications in electronics, photonics, information storage and sensing : symposium held April 21-25, 2003, San Francisco, California, U.S.A.. pp.253-258, 2003. Warrendale, Pa.. Materials Research Society
Volpi, F. ; Peaker, A.R. ; Berbezier, I. ; Ronda, A.
Pub. info.:
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.88-95, 2003. Pennington, NJ. Electrochemical Society
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