Belyansky, M. ; Klymko, N. ; Madan, A. ; Mallikarjunan, A. ; Li, Y. ; Chakravarti, A. ; Deshpande, S. ; Domenicucci, A. ; Bedell, S. ; Adams, E. ; Coffin, J. ; Tai, L. ; Sun, S-P. ; Widodo, J. ; Lai, C-W.
Pub. info.:
Materials, technology and reliability of advanced interconnects - 2005 : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A.. pp.97-102, 2005. Warrendale, Pa.. Materials Research Society
Belyansky, M. ; Klymko, N. ; Madan, A. ; Mallikarjunan, A. ; Li, Y. ; Chakravarti, A. ; Deshpande, S. ; Domenicucci, A. ; Bedell, S. ; Adams, E. ; Coffin, J. ; Tai, L. ; Sun, S-P. ; Widodo, J. ; Lai, C-W.
Pub. info.:
Thin films : stresses and mechanical properties XI : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A.. pp.325-332, 2005. Warrendale, Pa.. Materials Research Society
Belyansky, M. ; Conti, R. ; Upham, A. ; Liucci, F. ; Parks, C. ; Lee, K.-H. ; Strane, J.
Pub. info.:
Rapid thermal and other short-time processing technologies III : proceedings of the international symposium. pp.47-52, 2002. Pennington, NJ. Electrochemical Society
Belyansky, M. ; Trenary, M. ; Otani, S. ; Tanaka, T.
Pub. info.:
Thin films - structure and morphology : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.. pp.463-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society