1.

Conference Proceedings
Conference Proceedings
1. PROCESS DEPENDENT MORPHOLOGY OF THE Si/Si02 INTERFACE MEASURED WITH SCANNING TUNNELING MICROSCOPY
Hecht, Michael H. ; Bell, L. D. ; Grunthaner, F. J. ; Kaiser, W. J.
Pub. info.: SiO[2] and its interfaces : symposium held November 30-December 5, 1987, Boston, Massachusetts, U.S.A..  pp.307-312,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 105
2.

Conference Proceedings
Conference Proceedings
2. A novel low-voltage electron-bombarded CCD readout [6266-38]
Morrissey, P. ; Kaye, S. ; Martin, C. ; Sheung, J. ; Nikzad, S. ; Jones, T. ; Blacksberg, J. ; Hoenk, M. ; Bell, L. D.
Pub. info.: Space Telescopes and Instrumentation II: Ultraviolet to Gamma Ray.  pp.626610-626610,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6266