1.

Conference Proceedings
Conference Proceedings
1. Quantum well infrared photodetector performance parameters vs.binding energy
Beekman,D.W. ; Little,J.W. ; Kennerly,S.W. ; Goldberg,A.C.
Pub. info.: Infrared Detectors and Focal Plane Arrays V : 14-17 April 1998, Orlando, Florida.  pp.453-460,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3379
2.

Conference Proceedings
Conference Proceedings
2. Measurement of GaAs/(Al,Ga)As materials parameters for QWIP design calculations
Leavitt,R.P. ; Beekman,D.W. ; Little,J.W.
Pub. info.: Infrared technology and applications XXV : 5-9 April 1999, Orlando, Florida.  pp.668-674,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3698
3.

Conference Proceedings
Conference Proceedings
3. Polarization-sensitive QWIP thermal imager
Beekman,D.W. ; Anda,J.B.Van
Pub. info.: Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA.  pp.102-112,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4028
4.

Conference Proceedings
Conference Proceedings
4. Simplified QWIPs for low-temperature and low-background applications
Tidrow,M.Z. ; Beekman,D.W. ; Kennerly,S.W. ; Jiang,X. ; Li,S.S. ; Singh,A. ; Dodd,M.A.
Pub. info.: Infrared Detectors and Focal Plane Arrays V : 14-17 April 1998, Orlando, Florida.  pp.268-273,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3379
5.

Conference Proceedings
Conference Proceedings
5. Device physics and focal plane array applications of QWIP and MCT
Tidrow,M.Z. ; Beck,W.A. ; Clark,W.W. ; Pollehn,H.K. ; Little,J.W. ; Dhar,N.K. ; Leavitt,R.P. ; Kennerly,S.W. ; Beekman,D.W. ; Coldberg,A.C. ; Dyer,W.R.
Pub. info.: Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California.  pp.100-113,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3629