1.

Conference Proceedings

Conference Proceedings
Bryja,L. ; Ciorga,M. ; Misiewicz,J. ; Becla,P.
Pub. info.: Solid state crystals, growth and characterization : 7-11 October 1996, Zakopane, Poland.  pp.266-269,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3178
2.

Conference Proceedings

Conference Proceedings
McCluskey,M.D. ; Haller,E.E. ; Walukiewicz,W. ; Becla,P.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1247-1252,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings

Conference Proceedings
Szatkowski,J. ; Ptaczek-Popko,E. ; Sierariski,K. ; Hajdusianek,A. ; Becla,P.
Pub. info.: Single crystal growth, characterization, and applications : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.150-155,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3724
4.

Conference Proceedings

Conference Proceedings
Shan,Y.Y. ; Lynn,K.G. ; Szeles,Cs. ; Asoka-Kumar,P. ; Thio,T. ; Bennett,J.W. ; Beling,C.B. ; Fung,S. ; Becla,P.
Pub. info.: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.506-508,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 255-257