1.

Conference Proceedings
Conference Proceedings
1. X-ray Diffuse Scattering Investigation of Defects in Ion-Implanted and Annealed Silicon
Chang, C. H. ; Beck, U. ; Metzger, T. H. ; Patel, J. R.
Pub. info.: Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A..  pp.95-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 524
2.

Conference Proceedings
Conference Proceedings
2. Effects of Titanium Surface Topography on the Cell-Extracellular Matrix Interaction in Osteoblasts
Nebe, B. ; Luthen, F. ; Baumann, A. ; Beck, U. ; Diener, A. ; Neumann, H.-G. ; Rychly, J.
Pub. info.: THERMEC '2003 : International Conference on Processing & Manufacturing of Advanced Materials, July 7-11, 2003, Leganés, Madrid, Spain.  pp.3023-3030,  2003.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 426-432
3.

Conference Proceedings
Conference Proceedings
3. Metrological characterization of nanometer film thickness standards for XRR and ellipsometry applications
Hasche, K. ; Thomsen-Schmidt, P. ; Krumrey, M. ; Ade, G. ; Ulm, G. ; Stuempel, J. ; Schaedlich, S. ; Frank, W. ; Procop, M. ; Beck, U.
Pub. info.: Recent Developments in Traceable Dimensional Measurements II.  pp.165-172,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5190