1.

Conference Proceedings

Conference Proceedings
Vogler,K. ; Voss,F. ; Bergmann,E. ; Stamm,U. ; Walecki,W.J. ; Basting,D.
Pub. info.: Laser-induced damage in optical materials, 2000 : 32nd Annual Boulder Damage Symposium, proceedings, 16-18, October, 2000, Boulder, Colorado.  pp.445-446,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4347
2.

Conference Proceedings

Conference Proceedings
Govorkov,S.V. ; Slobodtchikov,E.V. ; Wiessner,A.O. ; Basting,D.
Pub. info.: Laser applications in microelectronic and optoelectronic manufacturing V : 24-26 January 2000, San Jose, USA.  pp.365-370,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3933
3.

Conference Proceedings

Conference Proceedings
Mehlmann,C. ; Schroder,T. ; Klopp,P. ; Koch,R. ; Stamm,U. ; Basting,D.
Pub. info.: Laser applications in microelectronic and optoelectronic manufacturing IV : 25-27 January 1999, San Jose, California.  pp.396-402,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3618
4.

Conference Proceedings

Conference Proceedings
Stamm,U. ; Patzel,R. ; Kleinschmidt,J. ; Vogler,K. ; Zschocke,W. ; Bragin,I. ; Basting,D.
Pub. info.: Optical microlithography XI : 25-27 February 1998, Santa Clara, California.  pp.1010-1013,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3334
5.

Conference Proceedings

Conference Proceedings
Stamm,U. ; Paetzel,R. ; Bragin,I. ; Berger,V. ; Klaft,I. ; Kleinschmidt,J. ; Osmanov,R. ; Schroeder,T. ; Vogler,K. ; Zschocke,W. ; Basting,D.
Pub. info.: Optical microlithography XII : 17-19 March 1999, Santa Clara, California.  Part2  pp.1050-1057,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3679
6.

Conference Proceedings

Conference Proceedings
Stamm,U. ; Bragin,I. ; Govorkov,S.V. ; Kleinschmidt,J. ; Patzel,R. ; Slobodtchikov,E. ; Vogler,K. ; F.Voヲツ ; Basting,D.
Pub. info.: Emerging lithographic technologies III : 15-17 March 1999, Santa Clara, California.  Part2  pp.816-826,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3676
7.

Conference Proceedings

Conference Proceedings
Bragin,I. ; Berger,V. ; Patzel,R. ; Stamm,U. ; Targsdorf,A. ; Kleinschmidt,J. ; Basting,D.
Pub. info.: Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA.  Part2  pp.1445-1451,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4000
8.

Conference Proceedings

Conference Proceedings
Basting,D. ; Pippert,K.D. ; Stamm,U.
Pub. info.: Second International Symposium on Laser Precision Microfabrication : 16-18 May 2001, Singapore.  pp.25-34,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4426
9.

Conference Proceedings

Conference Proceedings
Schriever,G. ; Rahe,M. ; Neff,W. ; Bergmann,K. ; Lebert,R. ; Lauth,H. ; Basting,D.
Pub. info.: Emerging lithographic technologies IV : 28 February-1 March 2000, Santa Clara, USA.  pp.162-168,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3997
10.

Conference Proceedings

Conference Proceedings
Dusterer,S. ; Rahe,M. ; Rebhan,U. ; Basting,D. ; Walecki,W.J. ; Lauth,H. ; Lebert,R. ; Bergmann,K. ; Hoffmann,D. ; Rosier,O. ; Neff,W. ; Poprawe,R. ; Sauerbrey,R.A. ; Schwoerer,H. ; Ziener,C. ; Nickles,P.V. ; Stiehl,H. ; Will,I. ; Sandner,W.
Pub. info.: Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA.  pp.113-120,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4146