1.

Conference Proceedings

Conference Proceedings
Barton,J. ; Compagno,A. ; O'Mathuna,S.C.
Pub. info.: In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK.  pp.31-40,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4406
2.

Conference Proceedings

Conference Proceedings
Barton,J. ; Hirst,E. ; Kaye,P. ; Saunders,S. ; Clark,D.
Pub. info.: Air monitoring and detection of chemical and biological agents II : 21-22 September 1999, Boston, Massachusetts.  pp.92-100,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3855
3.

Conference Proceedings

Conference Proceedings
Chan,E.K. ; Amini,B. ; Barton,J. ; Welch,A.J. ; Thomsen,S.L. ; Stoneman,R.C. ; Esterowitz,L.
Pub. info.: Proceedings of laser-tissue interaction VII : 29 January-1 February 1996, San Jose, California.  pp.102-113,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2681