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Conference Proceedings

1. Temperature measurements by laser beam deflection

Martinez, P. G. ; Bante, J. ; Alvarado-Gil, J. J.

Pub. info.:	Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico. pp.804-811, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5776

Conference Proceedings

2. A novel integrated system for analysis of thermal depth profiles

Bante, J. ; Murray, C. ; Alvarado-Gil, J. J.

Pub. info.:	Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico. pp.485-492, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5776