1.

Conference Proceedings
Conference Proceedings
1. Stress-induced effects in semiconducting epitaxial layers
Bak-Misiuk,J. ; Domagala,J. ; Misiuk,A. ; Kaniewski,J. ; Adamczewska,J. ; Trela,J. ; Reginski,K. ; Dobosz,D. ; Prujszczyk,M. ; Tedenac,J.C.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.262-266,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
2.

Conference Proceedings
Conference Proceedings
2. Effect of stress exerted by Si3N4 and SiO2 insulation layers on donor generation in surface layer of Czochralski-grown silicon
Jung,W. ; Misiuk,A. ; Bak-Misiuk,J. ; Rozental,M.
Pub. info.: Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.218-221,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3725
3.

Conference Proceedings
Conference Proceedings
3. Single crystals of ZnTe and(Cd.Zn)Te produced by physical vapor transport technique for MBE(substrates)and other applications
Mycielski,A. ; Szadkowski,A. ; Lusakowska,E. ; Kowalczyk,L. ; Domagafa,J. ; Bak-Misiuk,J. ; Witkowska,B. ; Adamiec,K. ; Rutkowski,J. ; Jedrzejczak,A.
Pub. info.: Single crystal growth, characterization, and applications : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.10-17,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3724
4.

Conference Proceedings
Conference Proceedings
4. On the Sensitivity of Optical Reflectivity Spectra to the Bulk Defects in Semiconductors-Example of Crystalline Si
Iwanowski,R.J. ; Kowalski,B.J. ; Orlowski,B.A. ; Bak-Misiuk,J.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.183-188,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
5.

Conference Proceedings
Conference Proceedings
5. Reciprocal lattice mapping of InGaAs Layers grown on InP(001)and GaAs(001)substrates
Bak-Misiuk,J. ; Kaniewski,J. ; Domagata,J. ; Reginski,K. ; Adamczewska,J. ; Trela,J.
Pub. info.: Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.47-52,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3725
6.

Conference Proceedings
Conference Proceedings
6. Effect of high-pressure high-temperature treatment on neutron-irradiation-induced defects in Czochralski silicon
Londos,C.A. ; Fytros,L.G. ; Misiuk,A. ; Bak-Misiuk,J. ; Prujszczyk,M. ; Potsidou,M.
Pub. info.: International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals.  pp.91-96,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4412
7.

Conference Proceedings
Conference Proceedings
7. Effect of stress on defect transformation in hydrogen-implanted silicon and SOI structures
Antonova,J.V. ; Popov,V.P. ; Bak-Misiuk,J. ; Domagala,J. ; Misiuk,A. ; Obodnikov,V.I. ; Gutakovskii,A.K. ; Romano-Rodriguez,A.
Pub. info.: International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals.  pp.120-125,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4412
8.

Conference Proceedings
Conference Proceedings
8. Investigation of system Si-O (SiOx) behavior in DAC at submegabar pressure
Efros,B.M. ; Shishkova,N.V. ; Prudnikov,A. ; Misiuk,A. ; Bak-Misiuk,J. ; Hartwig,J.
Pub. info.: International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals.  pp.110-115,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4412