1.

Conference Proceedings
Conference Proceedings
1. *CHANGES IN ELECTRONIC DEVICE PROPERTIES DURING THE FORMATION OF DISLOCATIONS
Ross, F.M. ; Hull, R. ; Bahnck, D. ; Bean, J.C. ; Peticolas, L.J. ; Kola, R.R. ; King, C.A.
Pub. info.: Evolution of surface and thin film microstructure : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.483-492,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 280
2.

Conference Proceedings
Conference Proceedings
2. Experimental Measurement of Transmission Electron Microscope Speciman Temperature During Ion Milling
Bahnck, D. ; Hull, R.
Pub. info.: Specimen preparation for transmission electron microscopy of materials--II : symposium held April 19-20, 1990, San Francisco, California, U.S.A..  pp.253-262,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 199
3.

Conference Proceedings
Conference Proceedings
3. REDUCED AMORPHIZATION OF ION-MILLED SILICON CROSS-SECTION TRANSMISSION ELECTRON MICROSCOPE SAMPLES BY DYNAMIC ANNEALING DURING MILLING
Bahnck, D. ; Hull, R.
Pub. info.: Specimen preparation for transmission electron microscopy of materials III : symposium held December 5-6, 1991, Boston, Mass., U.S.A..  pp.249-256,  1992.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 254
4.

Conference Proceedings
Conference Proceedings
4. Selective and Non-Selective Rapid Thermal Epitaxy of Si/Si1-xGe, Heterojunction Bipolar Transistors
King, C.A. ; Johnson, R.W. ; Snyder, C.W. ; Bahnck, D. ; Cargo, J. ; Luftman, H.S.
Pub. info.: Proceedings of the Thirteenth International Symposium on Chemical Vapor Deposition.  pp.324-329,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-5
5.

Conference Proceedings
Conference Proceedings
5. *THE ROLES OF STRESS, GEOMETRY AND ORIENTATION ON MISFIT DISLOCATIONS KINETICS AND ENERGETICS IN EPITAXIAL STRAINED LAYERS
Hull, R. ; Bean, J. C. ; Ross, F. ; Bahnck, D. ; Peticolas, L. J.
Pub. info.: Thin films : stresses and mechanical properties III : symposium held December 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.379-394,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 239
6.

Conference Proceedings
Conference Proceedings
6. HETERONUCLEATION ONTO Si SURFACES
Hull, R. ; Bean, J. C. ; Chand, N. ; Leibenguth, R. E. ; Bahnck, D. ; Koch, S. M. ; Harris Jr., J. S.
Pub. info.: Epitaxy of semiconductor layered structures : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A..  pp.455-462,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 102
7.

Conference Proceedings
Conference Proceedings
7. Nano-Scale Imaging of Compositional Defect and Dopant Distributions in Semiconductor Laser Heterostructures
Hull, R. ; Moore, M. ; Bahnck, D. ; Geva, M. ; Karlicek, R.F., Jr. ; Stevie, F.A. ; Walker, J.F.
Pub. info.: Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII).  pp.23-38,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-6