1.

Conference Proceedings

Conference Proceedings
Kim, Y.H. ; Kim, S.R. ; Cho, K.H. ; Bae, S.Y. ; Kwon, W.T.
Pub. info.: Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China.  pp.926-929,  2006.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 510-511
2.

Conference Proceedings

Conference Proceedings
Bae, S.Y. ; Ann, I.S. ; Sung, T.K. ; Park, O.K.
Pub. info.: Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China.  pp.366-369,  2006.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 510-511
3.

Conference Proceedings

Conference Proceedings
Chung, J.K. ; Bae, S.Y. ; Lee, S.G. ; Park, C. ; Yoo, S.I. ; Kim, C.J.
Pub. info.: Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China.  pp.258-261,  2006.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 510-511
4.

Conference Proceedings

Conference Proceedings
Kwon, W.T. ; Kim, Y.P. ; Kim, Y.H. ; Kim, S.R. ; Bae, S.Y.
Pub. info.: Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China.  pp.622-625,  2006.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 510-511
5.

Conference Proceedings

Conference Proceedings
Bae, S.Y. ; Hayworth, K.J. ; Yee, K.Y. ; Shcheglov, K. ; Wiberg, D.V.
Pub. info.: Design, test, integration, and packaging of MEMS/MOEMS 2002 : 6-8 May, 2002, Cannes, France.  pp.316-324,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4755