1.

Conference Proceedings

Conference Proceedings
Ashley,P.R. ; Temmen, M.G. ; Sanghadasa,M.
Pub. info.: Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA.  pp.104-115,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4648
2.

Conference Proceedings

Conference Proceedings
Kranz,M.S. ; Hudson,T.D. ; Ashley,P.R. ; Ruffin,P.B. ; Burgett,S.J. ; Temmen,M. ; Tuck,J.
Pub. info.: MEMS components and applications for industry, automobiles, aerospace, and communication : 22-23 October 2001, San Francisco, USA.  pp.5-16,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4559
3.

Conference Proceedings

Conference Proceedings
Hudson,T.D. ; McMillen,D.K. ; Ashley,P.R. ; Ruffin,P.B. ; Baeder,J.
Pub. info.: Acquisition, tracking, and pointing XIII : 7-8 April 1999, Orlando, Florida.  pp.112-122,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3692
4.

Conference Proceedings

Conference Proceedings
Abdeldayem,H.A. ; Frazier,D.O. ; Paley,M.S. ; Penn,B.G. ; Witherow,W.K. ; Bank,C. ; Shields,A. ; Hicks,R. ; Ashley,P.R.
Pub. info.: Space processing of materials : 4-5 August 1996, Denver, Colorado.  pp.125-135,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2809
5.

Conference Proceedings

Conference Proceedings
Lindsay,G.A. ; Chafin,A.P. ; Gratz,R. ; Hollins,R.A. ; Nadler,M.P. ; Nickel,E.G. ; Stenger-Smith,J.D. ; Yee,R. ; Herman,W.N. ; Zarris,P. ; Ashley,P.R.
Pub. info.: Optoelectronic Integrated Circuits.  pp.390-396,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3006