Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. pp.104-115, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
MEMS components and applications for industry, automobiles, aerospace, and communication : 22-23 October 2001, San Francisco, USA. pp.5-16, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Acquisition, tracking, and pointing XIII : 7-8 April 1999, Orlando, Florida. pp.112-122, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Space processing of materials : 4-5 August 1996, Denver, Colorado. pp.125-135, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering