1.

Conference Proceedings
Conference Proceedings
1. Development of Poly Buffer Isolation Technology at CEERI
Andhare,P.N. ; Tandon,U.S. ; Joshi,B.C. ; Pathak,B.C. ; Chandra,S. ; Wadhawan,O.P.
Pub. info.: Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999).  Part2  pp.811-814,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3975
2.

Conference Proceedings
Conference Proceedings
2. Development of Inverse TLDD Technique at CEERI
Andhare,P.N. ; Pant,B.D. ; Eranna,G. ; Virdi,G.S. ; Soni,R.N. ; Wadhawan,O.P.
Pub. info.: Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999).  Part2  pp.815-818,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3975
3.

Conference Proceedings
Conference Proceedings
3. Electromigration Induced By Radiatoin and Hot Electron Stress:A New Interactive Damage Phenomenon in Metal Interconnection
Andhare,P.N. ; Nahar,R.K. ; Devashrayee,N.M. ; Wadhawan,O.P.
Pub. info.: Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999).  Part2  pp.833-836,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3975
4.

Conference Proceedings
Conference Proceedings
4. Hot Electron and Radiation Induced Degradation-Interaction in Near Micron MOS Transistor
Andhare,P.N. ; Nahar,R.K. ; Wadhawan,O.P.
Pub. info.: Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999).  Part1  pp.333-336,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3975