1.

Conference Proceedings
Conference Proceedings
1. Analysis of structural and electrical characteristics of low dose SIMOX
Anc, M.J. ; Allen, L.P. ; McMarr, P.J. ; Mrstik, B.J. ; Hughes, H.L. ; Brothers, C.P.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.143-148,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
2.

Conference Proceedings
Conference Proceedings
2. Non-deatructive Impulsive Stimulated Thermal Scattering (ISTS) Analysis of SOI defects in SIMOX
Anc, M.J. ; Gostein, M. ; Banet, M. ; Allen, L.P.
Pub. info.: Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium.  pp.51-56,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-3
3.

Conference Proceedings
Conference Proceedings
3. Analysis of Microstructural Properties of SIMOX Wafers with Photoluminescence
Higgs, V. ; Anc, M.J.
Pub. info.: Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium.  pp.63-68,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-3
4.

Conference Proceedings
Conference Proceedings
4. Perspectives of SIMOX technology
Anc, M.J.
Pub. info.: Progress in SOI structures and devices operating at extreme conditions.  pp.1-10,  2002.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 58