1.

Conference Proceedings
Conference Proceedings
1. *SURFACE MICROSTRUCTURAL EVOLUTION OF ULTRATHIN FILMS BY REAL TIME SPECTROSCOPIC ELLIPSOMETRY
Collins, R. W. ; An, Ilsin ; Li, Y. M. ; Wronski, C. R.
Pub. info.: Interface dynamics and growth : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A..  pp.235-242,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 237
2.

Conference Proceedings
Conference Proceedings
2. Microstructure and Optical Functions of Transparent Conductors and Their Impact on Collection in Amorphous Silicon Solar Cells
Ferreira, G. M. ; Chen, Chi ; Ferlauto, A. S. ; Rovira, P. I. ; An, Ilsin ; Wronski, C. R. ; Collins, R. W. ; Ganguly, G. ; Kwak, Joong Hwan ; Lim, Koeng Su
Pub. info.: Amorphous and nanocrystalline silicon-based films - 2003 : symposium held April 22-25, 2003, San Francisco, California, U.S.A..  pp.515-520,  2003.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 762
3.

Conference Proceedings
Conference Proceedings
3. PREPARATION AND OPTICAL PROPERTIES OF ULTRATHIN SILICON FILMS
Collins, R. W. ; Nguyen, Hien V. ; An, Ilsin ; Lu, Yiwei ; Wakagi, M.
Pub. info.: Microcrystalline and nanocrystalline semiconductors : Symposium held November 29-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.763-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 358
4.

Conference Proceedings
Conference Proceedings
4. Rotating-Compensator Multichannel Ellipsometry: Applications in Process Development for Nanocrystalline Diamond Thin Films
Collins, R. W. ; Lee, Joungchel ; Rovira, P. I. ; An, Ilsin
Pub. info.: In situ process diagnostics and intelligent materials processing : symposium held December 2-5, 1997, Boston, Massachusetts, U.S.A..  pp.23-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 502
5.

Conference Proceedings
Conference Proceedings
5. SIMULTANEOUS REAL TIME SPECTROSCOPIC ELLIPSOMETRY AND REFLECTANCE FOR MONITORING SEMICONDUCTOR AND THIN FILM PREPARATION
An, Ilsin ; Nguyen, Hien V. ; Heyd, A. R. ; Collins, R. W.
Pub. info.: Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.33-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 324