1.

Conference Proceedings
Conference Proceedings
1. *DONOR-ACCEPTOR PAIRS IN SILICON
Altink, H. E. ; Gregorkiewicz, T. ; Ammerlaan, C. A. J.
Pub. info.: Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A..  pp.525-536,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 262
2.

Conference Proceedings
Conference Proceedings
2. ELECTRONIC GROUND STATE OF IRON-ACCEPTOR PAIRS IN SILICON
Ammerlaan, C. A. J. ; Van Kooten, J. J.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.525-532,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
3.

Conference Proceedings
Conference Proceedings
3. DEFECT IDENTIFICATION IN SILICON USING ELECTRON NUCLEAR DOUBLE RESONANCE
Ammerlaan, C. A. J. ; Sperenger, M. ; Van Kemp, R. ; Van Wezep, D. A.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.227-236,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
4.

Conference Proceedings
Conference Proceedings
4. TRAPPING OF MOLECULAR HYDROGEN IN POROUS SILICON AND AT Si/SiO2 INTERFACES AND A POSSIBLE REINTERPRETATION OF THE Pb CENTER
Stallinga, Peter ; Gregorkiewicz, T. ; Ammerlaan, C. A. J.
Pub. info.: Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.385-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 324
5.

Conference Proceedings
Conference Proceedings
5. Excitation and de-excitation mechanisms of rare-earth ions in III-V compounds: optically detected microwave-induced impact ionization of Yb dopant in InP
Gregorkiewicz, T. ; Liesert, B. J. Heijmink ; Tsimperidis, I. ; Matt-Gersdorf, I. De ; Ammerlaan, C. A. J. ; Godlewski, M. ; Scholz, F.
Pub. info.: Rare earth doped semiconductors : symposium held April 13-15, 1993, San Francisco, California, U.S.A..  pp.239-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 301
6.

Conference Proceedings
Conference Proceedings
6. The 4f Intrashell Transitions of Ytterbium in Indium Phosphide
Maat-Gersdorf, Ingrid de ; Gergorkiewicz, T. ; Ammerlaan, C. A. J. ; Christianen, P. C. M. ; Maan, J. C.
Pub. info.: Rare earth doped semiconductors II : symposium held April 8-10, 1996, San Francisco, California, U.S.A..  pp.161-,  1996.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 422
7.

Conference Proceedings
Conference Proceedings
7. Excitation and De-excitation of Yb3+ in InP and Er3+ in Si: Photoluminescence and Impact Ionization Studies
Gregorkiewicz, T. ; Tsimperidis, I. ; Ammerlaan, C. A. J. ; Widdershoven, F. P. ; Sobolev, N. A.
Pub. info.: Rare earth doped semiconductors II : symposium held April 8-10, 1996, San Francisco, California, U.S.A..  pp.207-,  1996.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 422