1.

Conference Proceedings

Conference Proceedings
Newman,R.C. ; Ashwin,M.J. ; Pritcbard,R.E ; Tucker,J.H. ; Lightowlers,E.C. ; Gregorkiewicz,T. ; Zevenbergen,I.S. ; Ammeriaan,C.A.J. ; Falster,R. ; Binns,M.J.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.379-384,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Martynov,Yu.V. ; Gregorkiewicz,T. ; Ammeriaan,C.A.J.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.849-854,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201