1.

Conference Proceedings
Conference Proceedings
1. Impacting Device Performance and Yield Through Sacrificial Oxidation Improvements
Ambadi,S. ; Hannoun,D. ; Kamekona,K. ; Pearse,J. ; Chang,G.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.467-474,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
2.

Conference Proceedings
Conference Proceedings
2. Characterization of tungsten silicide(WSix)film grown by chemical vapor deposition(CVD)
Hossain,F.R. ; Ambadi,S. ; Winer,R. ; Kitt,K. ; Garcia,C. ; Pearse,J.
Pub. info.: Microelectronic Device Technology III.  pp.58-61,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3881