1.

Conference Proceedings

Conference Proceedings
Conde-Contreras, M. ; Tiessler, V. ; Cucina, A. ; Quintana, P. ; Alvarado-Gil, J. J.
Pub. info.: Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico.  pp.515-523,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5776
2.

Conference Proceedings

Conference Proceedings
Martinez, P. G. ; Bante, J. ; Alvarado-Gil, J. J.
Pub. info.: Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico.  pp.804-811,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5776
3.

Conference Proceedings

Conference Proceedings
Bante, J. ; Murray, C. ; Alvarado-Gil, J. J.
Pub. info.: Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico.  pp.485-492,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5776
4.

Conference Proceedings

Conference Proceedings
Zambrano-Arjona, M. A. ; Smit, M. A. ; Alvarado-Gil, J. J.
Pub. info.: Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico.  pp.471-478,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5776
5.

Conference Proceedings

Conference Proceedings
Medina-Esquivel, R. ; Yahez-Limon, J. M. ; Alvarado-Gil, J. J.
Pub. info.: Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico.  pp.493-500,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5776