Lu, J.-Q. ; Jindal, A. ; Kwon, Y. ; McMahon, J.J. ; Lee, K-W. ; Craft, R.P. ; Altemus, B. ; Cheng, D. ; Eisenbraum, E. ; Cale, T.S. ; Gutmann, R.J.
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Thin film materials, processes, and reliability, plasma processing for the 100 nm node and copper interconnects with low-k inter-level dielectric films : proceedings of the international symposium. pp.381-389, 2003. Pennington, N.J.. Electrochemical Society
Xu, B. ; Castracane, J. ; Altemus, B. ; Keijmel, J. ; Heuzinkveld, M.
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Microfluidics, bioMEMS, and medical microsystems : 27-29 January 2003, San Jose, California, USA. pp.256-263, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Lu, J.-Q. ; Jindal, A. ; Kwon, Y. ; McMahon, J.J. ; Lee, K.-W. ; Kraft, R.P. ; Altemus, B. ; Cheng, D. ; Eisenbraun, E. ; Cale, T.S. ; Gutmann, R.J
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Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia. pp.87-95, 2003. Pennington, NJ. Electrochemical Society
Almasri, M. ; Altemus, B. ; Gracias, A. ; Clow, L. ; Tokranova, N. ; Castracane, J. ; Xu, B.
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Reliability, Testing, and Characterization of MEMS/MOEMS III. pp.79-86, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Olson, S. ; Sankaran, B. ; Altemus, B. ; Xu, B. ; Geer, R.
Pub. info.:
Testing, Reliability, and Application of Micro- and Nano-Material Systems III. pp.159-167, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering