Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. pp.125-138, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Mielke, M.M. ; Alphonse, G.A. ; Delfyett, P.J., Jr.
Pub. info.:
Enabling photonic technologies for aerospace applications V : 22-23 April, 2003, Orlando, Florida, USA. pp.14-17, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering