Almasri, M. ; Zhang, W. ; Kine, A. ; Chan, Y. ; LaRue, J. C. ; Nelson, R.
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Advanced sensor technologies for nondestructive evaluation and structural health monitoring : 8-10 March 2005, San Diego, California, USA. pp.190-198, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Almasri, M. ; Altemus, B. ; Gracias, A. ; Clow, L. ; Tokranova, N. ; Castracane, J. ; Xu, B.
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Reliability, Testing, and Characterization of MEMS/MOEMS III. pp.79-86, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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