1.

Conference Proceedings
Conference Proceedings
1. CHARACTERIZATION OF DOPE Si-TiSi2 BILAYERS FORMED BY ION BEAM MXING AND RAPID THERMAL ANNEALING
Maex, K. ; De Keersmaecker, R. F. ; Alkemade, P. F. A.
Pub. info.: Ion beam processes in advanced electronic materials and device technology : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.153-158,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 45
2.

Conference Proceedings
Conference Proceedings
2. Electromigration and 1/f Noise in Single-Crystalline, Bamboo, and Polycrystalline Al Lines
Homberg, Marc J. C. van den ; Alkemade, P. F. A. ; Verbruggen, A. H. ; Dirks, A. G. ; Ochs, E. ; Radelaar, S.
Pub. info.: Polycrystalline thin films : structure, texture, properties and applications III : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A..  pp.307-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 472
3.

Conference Proceedings
Conference Proceedings
3. Single-Crystalline and Bamboo Al Lines Fabricated by Graphoepitaxy: Microstructure and 1/f Noise Measurements
Homberg, Marc J. C. van den ; Verbruggen, A. H. ; Alkemade, P. F. A. ; Radelaar, S.
Pub. info.: Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.127-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 428
4.

Conference Proceedings
Conference Proceedings
4. Control of the Microstructure of Al Metallization by Graphoepitaxy
Homberg, Marc J. C. Van Den ; Alkemade, P. F. A. ; Hurd, J. L. ; Leusink, G. J. ; Radelaar, S.
Pub. info.: Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.397-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 391
5.

Conference Proceedings
Conference Proceedings
5. Electromigration and 1/f Noise in Single-Crystalline, Bamboo and Polycrystalline Al Lines
Homberg, Marc J. C. van den ; Alkemade, P. F. A. ; Verbruggen, A. H. ; Dirks, A. G. ; Ochs, E. ; Radelaar, S.
Pub. info.: Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A..  pp.211-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 473