1.

Conference Proceedings
Conference Proceedings
1. Electromigration Induced Drift and Noise in a Single Aluminum Via
Alers, G. B. ; Oates, A. S. ; Beverly, N. L.
Pub. info.: Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.501-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 391
2.

Conference Proceedings
Conference Proceedings
2. Effect of Thermal Stability and Roughness on Electrical Properties of Tantalum Oxide Gates
Alers, G. B. ; Stirling, L. A. ; Vandover, R. B. ; Chang, J. P. ; Werder, D. J. ; Urdahl, R. ; Rajopalan, R.
Pub. info.: Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A..  pp.391-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 567
3.

Conference Proceedings
Conference Proceedings
3. Spectroscopic Ellipsometry of Ta2O5 on Si
Richter, C. A. ; Nguyen, N. V. ; Alers, G. B.
Pub. info.: Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A..  pp.559-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 567
4.

Conference Proceedings
Conference Proceedings
4. 1/f Noise in the Tunneling Current of Thin Gate Oxides
Alers, G. B. ; Monroe, D. ; Krisch, K. S. ; Weir, B. E. ; Chang, A. M.
Pub. info.: Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.311-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 428
5.

Conference Proceedings
Conference Proceedings
5. Soft Breakdown in Ultrathin Oxides
Weir, B. E. ; Silverman, P. J. ; Alers, G. B. ; Monroe, D. ; Alam, M. A. ; Sorsch, T. W. ; Green, M. L. ; Timp, G. L. ; Ma, Y. ; Frei, M. ; Liu, C. T. ; Bude, J. D. ; Krisch, K. S.
Pub. info.: Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A..  pp.301-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 567
6.

Conference Proceedings
Conference Proceedings
6. Oxygen diffusion in tantalum oxide metal-oxide-metal capacitor structures
Chang, J. P. ; Steigerwald, M. L. ; Fleming, R. M. ; Opila, R. L. ; Alers, G. B.
Pub. info.: Multicomponent oxide films for electronics : symposium held April 6-8, 1999, San Francisco, California, U.S.A..  pp.329-,  1999.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 574