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Imaging spectrometry VIII : 8-10 July 2002, Seattle, Washington, USA. pp.415-425, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Knudsen, John F. ; Bowman, Jr., R.C. ; Adams, P.M. ; Newman, R. ; Hurrell, J.P. ; Cole, R.C. ; Halle, L.F. ; Barker, D.H.
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