1.

Conference Proceedings
Conference Proceedings
1. Stress-induced effects in semiconducting epitaxial layers
Bak-Misiuk,J. ; Domagala,J. ; Misiuk,A. ; Kaniewski,J. ; Adamczewska,J. ; Trela,J. ; Reginski,K. ; Dobosz,D. ; Prujszczyk,M. ; Tedenac,J.C.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.262-266,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
2.

Conference Proceedings
Conference Proceedings
2. Design and fabrication of GaSb/InGaAsSb/AlGaAsSb mid-IR photodetectors
Piotrowski,T.T. ; Piotrowska,A. ; Kaminska,E. ; Piskorski,M. ; Papis,E. ; Golaszewska,K. ; Katcki,J. ; Ratajczak,J. ; Adamczewska,J. ; Wawro,A. ; Piotrowski,J. ; Orman,Z. ; Pawluczyk,J. ; Nowak,Z. ; Piotrowski,T.T.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.339-344,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
3.

Conference Proceedings
Conference Proceedings
3. Technology and properties of GaAlAsSb layers grown on GaSb substrates
Piskorski,M. ; Papis,E. ; Piotrowski,T.T. ; Golaszewska,K. ; Katcki,J. ; Ratajczak,J. ; Adamczewska,J. ; Barcz,A. ; Zielinski,M. ; Piotrowska,A.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.76-81,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
4.

Conference Proceedings
Conference Proceedings
4. Reciprocal lattice mapping of InGaAs Layers grown on InP(001)and GaAs(001)substrates
Bak-Misiuk,J. ; Kaniewski,J. ; Domagata,J. ; Reginski,K. ; Adamczewska,J. ; Trela,J.
Pub. info.: Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.47-52,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3725