1.

Conference Proceedings
Conference Proceedings
1. Formation of Ultra Shallow Donors in Silicon by Long-Term-Annealing at 470 °C
Aberg,D. ; Hallberg,T. ; Svensson,B.G. ; Lindstrom,J.L. ; Kleverman,M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.385-390,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings
Conference Proceedings
2. Formation of Oxygen Dimers in Silicon during Electron-Irradiation Above 250 °C
Lindstrom,J.L. ; Hallberg,T. ; Aberg,D. ; Svensson,B.G. ; Murin,L.I. ; Markevich,V.P.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.367-372,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263