1.

Conference Proceedings

Conference Proceedings
K. L. Saenger ; J. P. de Souza ; K. E. Fogel ; J. A. Ott ; A. Reznicek ; C. Y. Sung ; H. Yin ; D. K. Sadana
Pub. info.: Transistor scaling--methods, materials and modeling : symposium held April 18-19, 2006, San Francisco, California, U.S.A..  pp.3-12,  2006.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 913
2.

Conference Proceedings

Conference Proceedings
D. Sadana ; M. Yang ; S.W. Bedell ; A. Reznicek ; J.P. de Souza
Pub. info.: SiGe and Ge, materials, processing, and devices.  pp.833-840,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(7)
3.

Conference Proceedings

Conference Proceedings
S.W. Bedell ; K. Fogel ; A. Reznicek ; J. Ott ; D. Sadana
Pub. info.: SiGe and Ge, materials, processing, and devices.  pp.807-816,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(7)
4.

Conference Proceedings

Conference Proceedings
B. Yang ; J. De Souza ; K. Saenger ; S. Bedell ; A. Reznicek
Pub. info.: SiGe, Ge, and Related Compounds 3: Materials, Processing, and Devices.  pp.1021-1024,  2008.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(10)
5.

Conference Proceedings

Conference Proceedings
D. Sadana ; S. Koester ; Y. Sun ; E. W. Kiewra ; S. W. Bedell ; A. Reznicek ; J. Ott ; K. Fogel ; D. J. Webb ; J. Fompeyrine ; J. Locquet ; M. Sousa ; R. Germann
Pub. info.: Advanced gate stack, source/drain and channel engineering for Si-based CMOS 2: new materials, processes, and equipment.  pp.343-354,  2006.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(2)