Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA. pp.63180J-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea. pp.63523J-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.915-918, 2006. Stafa-Zuerich. Trans Tech Publications
Ho, J. ; Wang, Y. ; Hou, Y.-C. ; Lin, B. S.-M. ; Yu, C. C. ; Wu, K. ; Ma, C.
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Design and process integration for microelectronic manufacturing IV : 23-24 February, 2006, San Jose, California, USA. pp.61560C-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea. pp.635221-635221, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Zhang, R. ; Wang, Y. ; Li, D. ; Zhao, J. ; Song, D.
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Geoinformatics 2006 : Remotely sensed data and information : 28-29 October 2006, Wuhan, China. pp.64191P-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Geoinformatics 2006 : Geospatial information technology : 28-29 October 2006, Wuhan, China. pp.64210K-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wang, Y. ; Swartz, A. ; Lynch, J. P. ; Law, K. H. ; Lu, K.-C. ; Loh, C.-H.
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Health monitoring and smart nondestructive evaluation of structural and biological systems V : 27 February-1 March 2006, San Diego, California, USA. pp.61770C-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Zhu, Z. ; Liu, R. ; Zhao, G. ; Fang, W. ; Wang, Y. ; Ma, Z.
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Remote sensing and modeling of ecosystems for sustainability III : 14-16 August 2006, San Diego, California, USA. pp.62981Z-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Liu, R. ; Shen, S. ; Zhu, Z. ; Fang, W. ; Wang, Y. ; Xu, P. ; Shi, L.
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Remote sensing and modeling of ecosystems for sustainability III : 14-16 August 2006, San Diego, California, USA. pp.62981Y-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Zhang, R. ; Wang, Y. ; Li, D. ; Zhao, J. ; Song, D.
Pub. info.:
Geoinformatics 2006 : Remotely sensed data and information : 28-29 October 2006, Wuhan, China. pp.64191K-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Geoinformatics 2006 : Geospatial information technology : 28-29 October 2006, Wuhan, China. pp.642105-642105, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wang, Y. ; Chen, L. ; Mikhov, M.K. ; Samson, G. ; Skromme, B.J.
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Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.363-366, 2006. Stafa-Zuerich. Trans Tech Publications
SAR image analysis, modeling, and techniques VIII : 13-14 September 2006, Stockholm, Sweden. pp.63630J-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies : Large mirrors and telescopes :2-5 November 2005, Xian, China. pp.61480J-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Willner, A. E. ; Zhang, L. ; Luo, T. ; Zhang, C. Yu. W. ; Wang, Y.
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Advanced optical and quantum memories and computing III : 24-25 January, 2006, San Jose, California, USA. pp.61300T-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
ICO20: remote sensing and infrared devices and systems : 21-26 August 2005, Changchun, China. pp.603118-603118, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
ICO20: remote sensing and infrared devices and systems : 21-26 August 2005, Changchun, China. pp.60310J-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Geoinformatics 2006 : Remotely sensed data and information : 28-29 October 2006, Wuhan, China. pp.64190T-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Defense transformation and network-centric systems : 17-20 April 2006, Kissimmee, Florida, USA. pp.62490Q-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ahmadkhanlou, F. ; Washington, G. N. ; Bechtel, S. E. ; Wang, Y.
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Smart structures and materials 2006 : Industrial and commercial applications of smart structures technologies : 27-28 February 2006, San Diego, California, USA. pp.61710I-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Lyapustin, A. ; Wang, Y. ; Kahn, R. ; Xiong, J. ; Ignatov, A. ; Wolfe, R. ; Wu, A. ; Bruegge, C.
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Remote sensing and modeling of ecosystems for sustainability III : 14-16 August 2006, San Diego, California, USA. pp.62980X-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
McCain, S. T. ; Gehm, M. E. ; Wang, Y. ; Pitsianis, N. P. ; Brady, D. J.
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Biomedical vibrational spectroscopy III : advances in research and industry : 21-22 and 24 January, 2006, San Jose, California, USA. pp.60930P-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Potuluri, P. ; Sullivan, M. E. ; Wang, Y. ; Brady, D. J.
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Advanced biomedical and clinical diagnostic systems IV : 22-24 January 2006, San Jose, California, USA. pp.60800C-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea. pp.635229-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Xiao, L. ; Wang, Y. ; Zhang, W. ; Huang, Y. ; Peng, J.
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Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea. pp.63520Q-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea. pp.63520A-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. pp.615031-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. pp.61502L-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. pp.61503V-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. pp.61503R-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. pp.61504B-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. pp.615040-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies. pp.61492J-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies. pp.61492T-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies. pp.61491D-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XX. pp.615241-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Security, Steganography, and Watermarking of Multimedia Contents VIII. pp.607202-607202, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Kuang, Y. ; Long, K. ; Wang, Y. ; Yang, X. ; Chen, Q. ; Li, Y.
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Network Architectures, Management, and Applications IV. pp.635420-635420, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sakurai, T. ; Yamamoto, S. ; Miyakawa, A. ; Wakazono, Y. ; Yoshida, T. O. ; Kohno, E. ; Tsuchiya-Susuki, R. ; Wang, Y. ; Hirukawa, H. ; Terakawa, S.
Pub. info.:
Imaging, Manipulation, and Analysis of Biomolecules, Cells, and Tissues IV. pp.608803-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Lu, L.-C ; Wang, Y. ; Lynch, J. P. ; Loh, C. H. ; Chen, Y.-J ; Lin, P. Y. ; Lee, Z. K.
Pub. info.:
Smart Structures and Materials 2006: Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems. pp.61741D-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation. pp.635801-635801, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation. pp.63580C-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Mathematics of Data/Image Pattern Recognition, Compression, and Encryption with Applications IX. pp.63150P-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wang, Y. ; Qi, C. ; Wang, D. ; Wang, J. ; Wang, P.
Pub. info.:
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation. pp.635828-635828, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation. pp.63583V-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wang, Y. ; Srituravanich, W. ; Sun, C. ; Zjhang, X.
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Plasmonics: Nanoimaging, Nanofabrication, and their Applications II. pp.632407-632408, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Wang, Y. ; Moghaddam, A. N. ; Behrens, G. ; Fatouraee, N. ; Cebral, J. ; Choi, E. T ; Amini, A. A. A
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Medical Imaging 2006: Physiology, Function, and Structure from Medical Images. pp.61430C-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation. pp.63581F-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies. pp.61490K-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wang, Y. ; Dong, S. ; Yang, Y. ; Liang, Y. ; Zou, H
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2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies. pp.61493F-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Watts, A. ; Huang, C. ; Wang, Y. ; Huynh, C. ; Benson, C. ; Smith, A.
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Photomask and Next-Generation Lithography Mask Technology XIII. pp.628303-628304, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Spectral Imaging: Eighth International Symposium on Multispectral Color Science. pp.60620C-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation. pp.63582R-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation. pp.635838-635938, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation. pp.63582O-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation. pp.63582S-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation. pp.63582K-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation. pp.63582N-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering