1.

Conference Proceedings
Conference Proceedings
1. Testing method for microprofile of optical supersmooth surface
Li,J. ; Xiao,S. ; Li,X. ; Ying,A. ; Zhang,X. ; Zhuo,A.
Pub. info.: Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore.  pp.398-403,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3897
2.

Conference Proceedings
Conference Proceedings
2. Testing method on nanometer-grade true microprofile of optical surface (Invited Paper)
Li,J. ; Li,X. ; Ying,A. ; Xiao,S. ; Wang,M. ; Zhao,A.
Pub. info.: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.276-281,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3557
3.

Conference Proceedings
Conference Proceedings
3. Inspecting the microprofile and defects of optical surfaces using an atomic-force microscope
Li,J. ; Xiao,S. ; Zhao,A. ; Li,D.
Pub. info.: Input/Output and Imaging Technologies.  pp.270-273,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3422