1.

Conference Proceedings
Conference Proceedings
1. CCD probe: application of linear array CCD in large-dimension measurement
Hao,Q. ; Cao,M. ; Zhao,Y. ; Li,D.
Pub. info.: Videometrics V : 30-31 July 1997, San Diego, California.  pp.330-334,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3174
2.

Conference Proceedings
Conference Proceedings
2. Measuring coaxiality and perpendicularity of the axis to an end plane using an optical method
Hao,Q. ; Zhao,Y. ; Li,D. ; Cao,M.
Pub. info.: Videometrics V : 30-31 July 1997, San Diego, California.  pp.317-320,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3174
3.

Conference Proceedings
Conference Proceedings
3. Application of laser diode fiber alignment in measuring large-scale perpendicularity and parallelism
Hao,Q. ; Liang,R. ; Cao,M. ; Li,D.
Pub. info.: Automated optical inspection for industry : 6-7 November 1996, Beijing, China.  pp.2-5,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2899
4.

Conference Proceedings
Conference Proceedings
4. Large-scale form and position error measurement
Hao,Q. ; Li,D.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.214-218,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558
5.

Conference Proceedings
Conference Proceedings
5. Instrument for measuring flatness by using laser and CCD
Hao,Q. ; Cao,M. ; Li,D.
Pub. info.: Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays : 8-9 August 1996, Denver, Colorado.  pp.183-186,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2862