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21 results

Conference Proceedings

1. Reconfigurable wavelength-routing all-optical network testbed

Zeng,Q. ; Hu,W. ; Chen,J. ; Ye,A. ; Chen,Y. ; Zhou,Y. ; Wu,K. ; Li,Y. ; Xiong,Y. ; Jin,Y. ; Han,Y. ; Xu,Z. ; Li,S. ; Chen,Y.

Pub. info.:	Fiber optic components and optical communication II : 18-19 September, 1998, Beijing, China. pp.348-352, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3552

Conference Proceedings

2. Difference between two kinds of electron traps in BaFCI:Eu2+

Wang,Y. ; Zhao,H. ; Xu,Z. ; Sun,L. ; Xu,X.

Pub. info.:	Optical storage technology : 16-18 September, 1998, Beijing, China. pp.140-142, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3562

Conference Proceedings

3. Electron transfer process in electron capture materials

Zhao,H. ; Wang,Y. ; Xu,Z. ; Cheng,Z. ; Xu,X.

Pub. info.:	Optical storage technology : 16-18 September, 1998, Beijing, China. pp.135-139, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3562

Conference Proceedings

4. Improved optical nonlinearity of poled phenylhydrazone-doped polymer films

Hou,J. ; Liu,L. ; Xu,L. ; Chen,J. ; Xu,Z. ; Wang,W. ; Li,F. ; Ye,M.

Pub. info.:	Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China. pp.50-56, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3556

Conference Proceedings

5. Parallel confocal detection method for three-dimensional surface topography with a micro-optic component

Tian,W. ; Bao,Z. ; Ding,Z. ; Sui,C. ; Xu,Z.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.191-196, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

Conference Proceedings

6. Diode-pumped Nd: YV04 laser at 671 nm

Zhang,H. ; He,J. ; Xu,Z. ; Wang,J. ; Wu,X. ; Wang,J.

Pub. info.:	High-power lasers : solid state, gas, excimer, and other advanced lasers II : 16-18 September 1998, Beijing, China. pp.83-85, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3549

Conference Proceedings

7. Energy attenuation of plane-parallel light in time-gated propagation through tissues

Chen,M. ; Chen,J. ; Xu,Z.

Pub. info.:	Biomedical optics and lasers : diagnostics and treatment : 16-18 September 1998, Beijing, China. pp.201-203, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3548

Conference Proceedings

8. Electro-optic grating for LiNbO3 waveguide high-speed modulation

Xu,Z. ; Rizzi,M. ; Castagnolo,B.

Pub. info.:	Diffractive and holographic device technologies and applications V : 28-29 January 1998, San Jose, California. pp.22-29, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3291

Conference Proceedings

9. UV/VIS liquid-core optical fiber long lightpath absorption system for spectrophotometer

Wang,W. ; Wu,G. ; Xu,Z. ; Liao,Y. ; He,Q. ; Wang,J. ; Feng,M.

Pub. info.:	Biomedical optics and lasers : diagnostics and treatment : 16-18 September 1998, Beijing, China. pp.212-216, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3548

10.

Conference Proceedings

10. Plasma damage monitoring for PECVD deposition: a contact potential difference study and device yield analysis

Xu,Z. ; Bencher,C. ; Le,M. ; Ngai,C.

Pub. info.:	In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II :23-24 September 1998 Santa Clara, California. pp.147-153, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3509

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