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34 results

Conference Proceedings

1. Infrared array camera (IRAC) for the Space Infrared Telescope Facility (SIRTF)

Fazio,G.G. ; Hora,J.L. ; Willner,S.P. ; Stauffer,J.R. ; Ashby,M.L.N. ; Wang,Z. ; Tollestrup,E.V. ; Pipher,J.L. ; Forrest,W.J. ; McCreight,C.R. ; Moseley,S.H. ; Hoffmann,W.F. ; Eisenhardt,P. ; Wright,E.L.

Pub. info.:	Infrared astronomical instrumentation : 23-25 March 1998, Kona, Hawaii. Part 2 pp.1024-1031, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3354

Conference Proceedings

2. Gaussian mutation in evolution strategies

Wang,Z. ; Yang,F. ; Yu,Y.

Pub. info.:	Applications and science of computational intelligence : 13-16 April 1998, Orlando, Florida. pp.308-311, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3390

Conference Proceedings

3. Effects of processing conditions on PbGeTe film performance

Zhang,S. ; Cheng,C. ; Ling,J. ; Fan,B. ; Zou,Z. ; Wang,Z. ; Zhang,J. ; Shi,T. ; Wang,G.

Pub. info.:	Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.429-432, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3175

Conference Proceedings

4. Robust phase-unwrapping algorithm for flat measurement in phase-stepping interferometry

Wei,C. ; Chen,M. ; Hou,W. ; Guo,H. ; Wang,Z.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.480-486, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

Conference Proceedings

5. Digital optical profiler with automatic reference phase calibration

Wei,C. ; Chen,M. ; Wang,Z.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.470-479, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

Conference Proceedings

6. Polarization-splitting characteristics of groove phase gratings with subwavelength structures

Zhang,Q. ; Wang,Z. ; Fu,K. ; Wen,J.

Pub. info.:	Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China. pp.185-190, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3557

Conference Proceedings

7. Determination of the electro-optic coefficients of DMACB/PEK-c polymer films using the quasi-waveguide rn-line method

Ren,Q. ; Wang,Z. ; Guo,S. ; Mu,X. ; Zhang,G. ; Xu,D.

Pub. info.:	Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China. pp.84-87, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3556

Conference Proceedings

8. Structural,dielectric,and optical properties of PT/PEK-c electro-optic polymer films

Ren,Q. ; Wang,Z. ; Xu,D. ; Guo,S. ; Zhang,G. ; Meng,F. ; Yuan,D.

Pub. info.:	Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China. pp.88-92, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3556

Conference Proceedings

9. Optical properties of DMACB-PEK-c polymer film

Ren,Q. ; Wang,Z. ; Guo,S. ; Mu,X. ; Xu,D.

Pub. info.:	Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.310-313, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3175

10.

Conference Proceedings

10. Luminescent Ge nanocrystallites embedded in a-SiO2 films

He,Z. ; Chen,K. ; Xu,J. ; Feng,D. ; Han,H.X. ; Wang,Z.

Pub. info.:	Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.37-41, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3175

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