1.

Conference Proceedings

Conference Proceedings
Wang,Q. ; He,L. ; Guo,Q. ; Li,W.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.339-343,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558
2.

Conference Proceedings

Conference Proceedings
Li,W. ; Su,X. ; Su,L. ; Xiang,L.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.125-130,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558
3.

Conference Proceedings

Conference Proceedings
Ma,T. ; Xu,J. ; Wang,L. ; Huang,X. ; Du,J. ; Li,W. ; Chen,K.
Pub. info.: Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China.  pp.446-450,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3175
4.

Conference Proceedings

Conference Proceedings
Xing,X. ; Zhai,C. ; Du,H. ; Li,W. ; Hu,H. ; Wang,R. ; Shi,D.
Pub. info.: Advanced Technology Optical.  pp.839-849,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3352
5.

Conference Proceedings

Conference Proceedings
McKnight,S.W. ; DiMarzio,C.A. ; Li,W. ; Hogenboom,D.O. ; Sauermann,G.O.
Pub. info.: Detection and remediation technologies for mines and minelike targets III : 13-17 April 1998, Orlando, Florida.  Part 2  pp.841-847,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3392
6.

Conference Proceedings

Conference Proceedings
Zhang,T. ; Hu,B. ; Li,W.
Pub. info.: Exploiting new image sources and sensors : 26th AIPR Workshop, 15-17 October 1997, Washington, D.C..  pp.306-311,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3240
7.

Conference Proceedings

Conference Proceedings
Wang,M. ; Huang,X. ; Li,W. ; Xu,J. ; Chen,K. ; Wang,Q.
Pub. info.: Integrated optic devices II : 28-30 January 1998, San Jose, California.  pp.340-345,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3278
8.

Conference Proceedings

Conference Proceedings
Malinsky,J.E. ; Li,W. ; Chou,H. ; Ma,W. ; Geng,L. ; Marks,T.J. ; Jabbour,C.E. ; Shaheen,S.E. ; Kippelen,B. ; Peyghambarian,N. ; Dutta,P. ; Richter,A.J. ; Armstrong,N.R. ; Lee,P.A. ; Anderson,J.D.
Pub. info.: Polymer photonic devices : 28-30 January 1998 San Jose, California.  pp.148-155,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3281
9.

Conference Proceedings

Conference Proceedings
Yang,L. ; Li,W.
Pub. info.: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.204-209,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3557
10.

Conference Proceedings

Conference Proceedings
Su,X. ; Su,L. ; Li,W. ; Xiang,L.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.1-7,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558