1.

Conference Proceedings
Conference Proceedings
1. Error rate improvement of super-RENS random signal with the minimum mark length of 75 nm in 405 nm 0.85 NA system [6282-66]
Bae, J. ; Kim, J. ; Hwang, I ; Kim, H. ; Lee, J. ; Park, H. ; Tominaga, J.
Pub. info.: Optical Data Storage 2006 : 23-26 April 2006, Montreal, Canada.  pp.628217-628218,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6282
2.

Technical Paper
Technical Paper
2. Cooling and Thermal Control Strategies in the Space Suit for Routine and Emergency Situations.
Koscheyev, V.S. ; Lee, J. ; Kim, J. ; Leon, G.R. ; Kwon, S.
Pub. info.: 38th International Conference on Environmental Systems : SAE technical paper.  2008.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2008
3.

Technical Paper
Technical Paper
3. Closed-Loop Evaluation of Vehicle Stability Control (VSC) Systems Using a Combined Vehicle and Human Driving Model.
Chung, T. ; Yi, K. ; Kim, J. ; Lee, J.
Pub. info.: 2004 SAE world congress : technical paper.  2004.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2004
4.

Conference Proceedings
Conference Proceedings
4. End-pumped vertical external cavity surface emitting laser [6132-14]
Kim, T. ; Lee, J. ; Lee, S. ; Yoo, J ; Kim, K. ; Kim, J. ; Cho, S ; Lim, S ; Kim, G ; Park, Y
Pub. info.: Vertical-Cavity Surface-Emitting Lasers X.  pp.61320D-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6132
5.

Conference Proceedings
Conference Proceedings
5. High NA polarized light lithography for O.29kl process [6154-15]
Park, C. ; Lee, J. ; Yang, K. ; Tseng, S. ; Min, Y.-H ; Yang, H. ; Yim, D. ; Kim, J.
Pub. info.: Optical Microlithography XIX.  pp.61540F-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6154
6.

Conference Proceedings
Conference Proceedings
6. Characterizing optical proximity effect difference among exposure tools [6152-103]
Hong, J. ; Lee, J. ; Kang, E. ; Yang, H. ; Yim, D. ; Kim, J.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XX.  pp.61522N-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6152
7.

Conference Proceedings
Conference Proceedings
7. DICOM structured report: implementation notes for basic structured reporting system
Kim, D. ; Lee, D. ; Lee, J. ; Park, H. ; Lim, H. ; Ahn, J. ; Kim, J.
Pub. info.: Medical Imaging 2002: PACS and Integrated Medical Information Systems: Design and Evaluation.  pp.407-415,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4685