Wavelet applications in signal and image processing VIII : 31 July-4 August, 2000, San Diego, USA. 4119 pp.878-885, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Applications of artificial neural networks in image processing V : 27-28 January 2000, San Jose, California. pp.246-255, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Scanning and force microscopies for biomedical applications : 23-24 January 2000, San Jose, California. pp.73-80, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Adaptive optical systems technology : 29-31 March, 2000, Munich, Germany. Part1 pp.200-209, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Symposium on Optical Storage (ISOS 2000) : 22-26 May 2000, Shanghai, China. pp.267-271, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China. pp.245-249, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China. pp.250-254, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Signal processing, sensor fusion, and target recognition IX : 24-26 April 2000, Orlando, USA. pp.270-275, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Inorganic optical materials II : 1-3 August, 2000, San Diego, USA. pp.204-210, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.393-396, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering