1.

Conference Proceedings

Conference Proceedings
Sandvik,P.M. ; Walker,D. ; Kung,P. ; Mi,K. ; Shahedipour,F. ; Kumar,V. ; Zhang,X. ; Diaz,J. ; Jelen,C.L. ; Razeghi,M.
Pub. info.: Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California.  pp.265-272,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3948
2.

Conference Proceedings

Conference Proceedings
Herrick,R.W. ; Lim,S.F. ; Deng,H. ; Deng,Q. ; Dudley,J.J. ; Keever,M.R. ; Oh,T. ; Li,M.Y. ; Tashima,M. ; Hodge,L.A. ; Zhang,X. ; Herniman,J. ; Evans,P. ; Liang,B.
Pub. info.: Vertical-cavity surface-emitting lasers IV : 26-28 January 2000, San Jose, California.  pp.14-19,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3946
3.

Conference Proceedings

Conference Proceedings
Zhang,X. ; Zhao,S. ; Wang,Q.
Pub. info.: Solid state lasers IX : 25-26 January 2000, San Jose, California.  pp.307-311,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3929
4.

Conference Proceedings

Conference Proceedings
Zhao,S. ; Zhang,X. ; Wang,Q. ; Zheng,J. ; Zhang,Q. ; Sun,L. ; Zhang,S.
Pub. info.: Solid state lasers IX : 25-26 January 2000, San Jose, California.  pp.261-265,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3929
5.

Conference Proceedings

Conference Proceedings
Zhang,X. ; Zhao,S. ; Wang,Q. ; Ozygus,B. ; Weber,H.
Pub. info.: Solid state lasers IX : 25-26 January 2000, San Jose, California.  pp.253-260,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3929
6.

Conference Proceedings

Conference Proceedings
Zhang,X. ; Yu,G. ; Qi,X. ; Yuan,L. ; Zou,F.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.283-286,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
7.

Conference Proceedings

Conference Proceedings
Wu,Z. ; Zhang,X. ; Sun,R. ; Li,W. ; Chen,K.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.761-764,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
8.

Conference Proceedings

Conference Proceedings
Zhou,G. ; Zhang,N. ; Li,H. ; Tian,J. ; Liu,W. ; Jing,W. ; Zhang,X. ; Zhang,Y.
Pub. info.: Optics in computing 2000 : 18-23 June 2000, Quebec city, Canada.  pp.981-986,  2000.  Bellingham, WA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4089
9.

Conference Proceedings

Conference Proceedings
Qu,Y. ; Bo,B. ; Gao,X. ; Zhan,B. ; Zhang,X. ; Shi,J.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.132-134,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
10.

Conference Proceedings

Conference Proceedings
Chen,S. ; He,M. ; Yi,X. ; Zhang,X.
Pub. info.: Infrared technology and applications XXVI : 30 July - 3 August 2000, San Diego, USA.  pp.283-291,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4130