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20 results

Conference Proceedings

1. Selective-proton-bombarded buried stripe laser and its modulation response

Yi,M. ; Zhang,B. ; Zhang,D. ; Sun,W. ; Tian,X.

Pub. info.:	Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California. pp.210-213, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3945

Conference Proceedings

2. Index gratings in low glass transition temperature polymer composites based on poly(N-vinylcarbazole)

Gong,Q. ; Wang,F. ; Zhang,B. ; Wang,P. ; Feng,Z. ; Ye,C.

Pub. info.:	Organic photonic materials and devices II : 24-26 January 2000, San Jose, USA. pp.112-116, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3939

Conference Proceedings

3. Color image saturation enhancement

Fang,F. ; Lin,M. ; Li,Y. ; Wang,Z. ; Zhang,B.

Pub. info.:	Applications of digital image processing XXIII : 31 July - 3 August 2000, San Diego, USA. pp.711-718, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4115

Conference Proceedings

4. Image enhancement and 2D-TDI technique of infrared system

Lei,C. ; Zhang,B.

Pub. info.:	Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China. pp.173-177, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4223

Conference Proceedings

5. Measurement and comparison of modulation transfer function and signal transfer function of image intensifiers

Liu,Y. ; Liu,W. ; Zhang,B. ; Wang,X. ; Jiang,J.

Pub. info.:	Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.252-256, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4221

Conference Proceedings

6. Methods for removing honeycomb noise from fiber endoscopic images

Fang,F. ; Lin,M. ; Guo,Y. ; Zhang,Y. ; Zhong,X. ; Zhang,B.

Pub. info.:	Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China. pp.60-63, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4224

Conference Proceedings

7. 3D test and analysis sytem on time-space SNR of low-light-level (LLL) CCD camera

Bai,L. ; Gu,G. ; Chen,Q. ; Zhang,B.

Pub. info.:	Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China. pp.178-182, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4223

Conference Proceedings

8. Imaging system of the Space Solar Telescope

Zhang,B. ; Jin,S.

Pub. info.:	Applications of digital image processing XXIII : 31 July - 3 August 2000, San Diego, USA. pp.629-637, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4115

Conference Proceedings

9. Tunable MQW-DBR lasers using selective area growth

Liu,G. ; Wang,W. ; Zhang,J. ; Chen,W. ; Xu,G. ; Zhang,B. ; Zhou,F. ; Wang,X. ; Zhu,H.

Pub. info.:	Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.143-146, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4086

10.

Conference Proceedings

10. Interferometric testing for large optical elements

Han,C. ; Zhang,X. ; Zhang,S. ; Ma,J. ; Wu,D. ; Zhang,B.

Pub. info.:	Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China. pp.269-276, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4231

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