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22 results

Conference Proceedings

1. Semiconducting ferroelectric SbSl quantum dots in organically modified TiO2 matrix

Ye,H. ; Xu,Y. ; Mackenzie,J.D.

Pub. info.:	Sol-gel optics V : 26-28 January 2000, San Jose, California. pp.95-101, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3943

Conference Proceedings

2. Finite element modeling for the flexural vibration of damped sandwich beams considering complex modulus of the adhesive layer

Xu,Y. ; Chen,D.

Pub. info.:	Smart structures and materials 2000 : damping and isolation : 6-8 March 2000, Newport Beach, California. pp.121-129, 2000. Bellingham, Washington. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3989

Conference Proceedings

3. Development and prospective of SOI-based photonic components for optical CDMA application

Tang,Y.S. ; Xu,Y. ; Chan,J.K.

Pub. info.:	Silicon-based optoelectronics II : 28 January 2000, San Jose, California. pp.2-10, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3953

Conference Proceedings

4. Manufacturing considerations for implementation of scatterometry for process monitoring

Allgair,J. ; Benoit,D.C. ; Hershey,R.R. ; Litt,L.C. ; Abdulhalim,I.S. ; Braymer,B. ; Faeyrman,M. ; Robinson,J.C. ; Whitney,U.K. ; Xu,Y. ; Zalicki,P. ; Seligson,J.L.

Pub. info.:	Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California. pp.125-134, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3998

Conference Proceedings

5. CD-R mastering and stamper quality testing

Zhang,G. ; He,H. ; Chen,G. ; Sun,J. ; Hu,Q. ; Zhou,J. ; Gan,B. ; Xu,Y. ; Sun,F.

Pub. info.:	Fifth International Symposium on Optical Storage (ISOS 2000) : 22-26 May 2000, Shanghai, China. pp.224-227, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4085

Conference Proceedings

6. New method of processing the signals of a position-sensitive detector

Xu,Y. ; Tang,J. ; Zhong,W.

Pub. info.:	Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China. pp.260-263, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4220

Conference Proceedings

7. 220-kV combined optical transformer

Cui,Y. ; Ye,M. ; Zhu,Y. ; Xu,Y. ; Luo,S.

Pub. info.:	Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China. pp.292-296, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4220

Conference Proceedings

8. Laser texturing process and surface quality control

Jiang,J. ; He,Y. ; Yan,Y. ; Zhao,W. ; Xu,Y.

Pub. info.:	First International Symposium on Laser Precision Microfabrication : 14-16 June 2000, Omiya, Saitama, Japan. pp.240-243, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4088

Conference Proceedings

9. Surface 3D topography measurement of roller

Jiang,J. ; He,Y. ; Zhao,W. ; Xu,Y. ; Yan,G.

Pub. info.:	Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.125-128, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4221

10.

Conference Proceedings

10. Several key techniques in the PIV system

Tang,H. ; Yang,Y. ; Xu,Y. ; Gao,X.

Pub. info.:	Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.361-365, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4221

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