1.

Conference Proceedings

Conference Proceedings
Liang,H. ; Zhu,Z. ; Xu,G. ; Liu,Z. ; Ni,G.
Pub. info.: Image and signal processing for remote sensing VI : 27-29 September 2000, Barcelona, Spain.  pp.272-279,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4170
2.

Conference Proceedings

Conference Proceedings
Xu,G. ; Jiang,Q.
Pub. info.: Smart structures and materials 2000 : mathematics and control in smart structures : 6-9 March, 2000, Newport Beach, USA.  pp.12-21,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3984
3.

Conference Proceedings

Conference Proceedings
Zhang,S.Z. ; Xu,G. ; Qui,W. ; Lin,F.S. ; Testa,R.C. ; Mattice,M.S.
Pub. info.: Smart structures and materials 2000 : smart electronics and MEMS : 6-8 March, 2000, Newport Beach, USA.  pp.185-193,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3990
4.

Conference Proceedings

Conference Proceedings
Deshpande,S. ; Shao,X. ; III,J.E.Lamb ; Brakensiek,N. ; Johnson,J. ; Wu,X. ; Xu,G. ; Simmons,B.
Pub. info.: Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California.  pp.797-805,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3998
5.

Conference Proceedings

Conference Proceedings
Xu,G. ; Bartha,J.M. ; Lin,F.S.
Pub. info.: Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA.  pp.148-156,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4028
6.

Conference Proceedings

Conference Proceedings
Xu,G. ; Tan,S.L. ; Low,S.P. ; Heng,Y.S. ; Lai,W.C. ; Du,X.
Pub. info.: Optical metrology roadmap for the semiconductor, optical, and data storage industries , 30-31 July 2000, San Diego, USA.  pp.154-165,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4099
7.

Conference Proceedings

Conference Proceedings
Liu,G. ; Wang,W. ; Zhang,J. ; Chen,W. ; Xu,G. ; Zhang,B. ; Zhou,F. ; Wang,X. ; Zhu,H.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.143-146,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
8.

Conference Proceedings

Conference Proceedings
Jannson,T.M. ; Xu,G. ; Lin,F.S.-H.
Pub. info.: Advances in optical information processing IX : 25-26 April 2000, Orlando, USA.  pp.147-158,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4046
9.

Conference Proceedings

Conference Proceedings
Meador,J.D. ; Shao,X. ; Krishnamurthy,V. ; Arjona,M. ; Bhave,M. ; Xu,G. ; Claypool,J.B. ; Lindgren,A.
Pub. info.: Advances in resist technology and processing XVII : 28 February - 1 March 2000, Santa Clara, USA.  Part2  pp.1009-1018,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3999
10.

Conference Proceedings

Conference Proceedings
Zhang,Y. ; Zhang,Z. ; Xu,G.
Pub. info.: Inorganic optical materials II : 1-3 August, 2000, San Diego, USA.  pp.204-210,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4102