1.

Conference Proceedings

Conference Proceedings
Norton,M.A. ; Hrubesh,L.W. ; Wu,Z. ; Donohue,E.E. ; Feit,M.D. ; Kozlowski,M.R. ; Milam,D. ; Need,K.P. ; Molander,W.A. ; Rubenchik,A.M. ; Sell,W.D. ; Wegner,P.J.
Pub. info.: Laser-induced damage in optical materials, 2000 : 32nd Annual Boulder Damage Symposium, proceedings, 16-18, October, 2000, Boulder, Colorado.  pp.468-468,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4347
2.

Conference Proceedings

Conference Proceedings
Jin,G.-C. ; Wu,Z. ; Bao,N.-K. ; Yao,X.-F.
Pub. info.: Second International Conference on Experimental Mechanics : 29 November-1 December 2000, Singapore.  pp.13-19,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4317
3.

Conference Proceedings

Conference Proceedings
Wu,Z. ; Goh,S.R. ; Kluenkaew,O. ; Tang,M.L. ; Prakash,E.C.
Pub. info.: Three-dimensional image capture and applications III : 24-25 January 2000, San Jose, California.  pp.187-191,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3958
4.

Conference Proceedings

Conference Proceedings
Goh,S.R. ; Kluenkaew,O. ; Tang,M.L. ; Wu,Z. ; Prakash,E.C.
Pub. info.: Three-dimensional image capture and applications III : 24-25 January 2000, San Jose, California.  pp.192-197,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3958
5.

Conference Proceedings

Conference Proceedings
Li,Z. ; Qiang,X. ; Wu,Z. ; Fan,C.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.135-139,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223
6.

Conference Proceedings

Conference Proceedings
Wu,Z. ; Boughriet,A.H. ; McCann,H. ; Davis,L.E. ; Nugroho,A.T.
Pub. info.: Process imaging for automatic control : 5-6 November 2000, Boston, USA.  pp.151-158,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4188
7.

Conference Proceedings

Conference Proceedings
Wu,Z. ; Zhang,X. ; Sun,R. ; Li,W. ; Chen,K.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.761-764,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
8.

Conference Proceedings

Conference Proceedings
Papandrew,A.B. ; Stolz,C.J. ; Wu,Z. ; Loomis,G.E. ; Falabella,S.
Pub. info.: Laser-induced damage in optical materials, 2000 : 32nd Annual Boulder Damage Symposium, proceedings, 16-18, October, 2000, Boulder, Colorado.  pp.53-61,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4347
9.

Conference Proceedings

Conference Proceedings
Wu,F. ; Liu,Y. ; Wang,X. ; Wu,Z.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.330-333,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
10.

Conference Proceedings

Conference Proceedings
Wu,F. ; Fang,Y. ; Li,Q. ; Wu,Z.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.27-30,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086