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29 results

Conference Proceedings

1. Atomic force microscopy observations of domains in fine-grain PZT ceramics

Wang,Z. ; Jiang,Q. ; Blendell,J.E. ; White,G.S.

Pub. info.:	Smart structures and materials 2000 : mathematics and control in smart structures : 6-9 March, 2000, Newport Beach, USA. pp.456-466, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3984

Conference Proceedings

2. Optical fiber sensor system for oil tanks

Liao,Y. ; Lai,S. ; Gong,J. ; Wang,Z. ; Zheng,X. ; Liu,G. ; Shao,Z. ; Sun,D. ; Qiu,S.

Pub. info.:	Applications of optical fiber sensors : 22-24 May 2000, Glasgow, Scotland, United Kingdom. pp.365-369, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4074

Conference Proceedings

3. Color image saturation enhancement

Fang,F. ; Lin,M. ; Li,Y. ; Wang,Z. ; Zhang,B.

Pub. info.:	Applications of digital image processing XXIII : 31 July - 3 August 2000, San Diego, USA. pp.711-718, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4115

Conference Proceedings

4. Aberration measurement of focal mirror by the phase shift in high-power CO2 laser processing

Wang,Z. ; Chen,H. ; Zuo,T.

Pub. info.:	Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.37-41, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4221

Conference Proceedings

5. Transient Simulation of Grown-in Defect Dynamics in Czochralski Crystal Growth of Silicon

Mori,T. ; Wang,Z. ; Brown,R.A.

Pub. info.:	High Purity Silicon VI : proceedings of the sixth International Symposium. pp.118-128, 2000. Pennington, N.J., Bellingham, Wash.. Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4218

Conference Proceedings

6. Three-dimensional optical tomography of incomplete data

Wang,Z. ; Li,Z. ; He,A.

Pub. info.:	Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.257-263, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4221

Conference Proceedings

7. Design considerations for contact laser scalpels

Li,Z. ; Xu,X. ; Wang,Z. ; Lai,J. ; Tao,H. ; He,A.

Pub. info.:	Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China. pp.122-130, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4224

Conference Proceedings

8. Fiber Bragg grating strain sensor with drift compensation for smart structures

Li,Z. ; Wang,Z. ; Tang,X. ; Qiang,X.

Pub. info.:	Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China. pp.131-134, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4223

Conference Proceedings

9. Rotation sensitivity of admittance of PZT ceramics

Wang,Z. ; Jiang,Q.

Pub. info.:	Smart structures and materials 2000 : Active materials : behavior and mechanics : 6-9 March, 2000, Newport Beach, USA. pp.396-403, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3992

10.

Conference Proceedings

10. Properties of sputter-deposited Fe-Pd thin films

Wang,Z. ; Iijima,T. ; He,G. ; Takahashi,T. ; Oikawa,K. ; Furuya,Y.

Pub. info.:	Smart materials. pp.284-291, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4234

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